729 search results - page 54 / 146 » A Transitive Closure Based Algorithm for Test Generation |
ICWS
2010
IEEE
13 years 9 months ago
2010
IEEE
This paper presents a methodology and a set of tools for the modelling, validation and testing of Web service composition, conceived and developed within the French national projec...
DATE
1999
IEEE
14 years 22 hour ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
ITC
2000
IEEE
14 years 3 days ago
2000
IEEE
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...
PKDD
2004
Springer
14 years 1 months ago
2004
Springer
The problem of discovering frequent subgraphs of graph data can be solved by constructing a candidate set of subgraphs first, and then, identifying within this candidate set those...
SBMF
2010
Springer
13 years 2 months ago
2010
Springer
Designers of concurrent and distributed algorithms usually express them using pseudo-code. In contrast, most verification techniques are based on more mathematically-oriented forma...