729 search results - page 8 / 146 » A Transitive Closure Based Algorithm for Test Generation |
VTS
2008
IEEE
14 years 1 months ago
2008
IEEE
— Higher chip densities and the push for higher performance have continued to drive design needs. Transition delay fault testing has become the preferred method for ensuring thes...
FATES
2006
Springer
13 years 11 months ago
2006
Springer
To efficiently solve safety verification and testing problems for an aspect-oriented system, we use multitape automata to model aspects and propose algorithms for the aspect-orient...
ICPR
2010
IEEE
13 years 11 months ago
2010
IEEE
Abstract--This paper extends the transition method for binarization based on transition pixels, a generalization of edge pixels. This method originally computes transition threshol...
GLVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
In modern IC design, the number of long on-chip wires has been growing rapidly because of the increasing circuit complexity. Interconnect delay has dominated over gate delay as te...
DAC
1994
ACM
13 years 11 months ago
1994
ACM
Conformational analysis is the problem of nding all minimal energy three-dimensional con gurations of molecules. Cyclic structures are of particular interest. An ecient algorithm...