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» A case study in test management
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DATE
2003
IEEE
84views Hardware» more  DATE 2003»
15 years 11 months ago
SoC Design and Test Considerations
: Modern SoC Design for high-volume products requires a strong focus on Design-for-Test and Designfor-Manufacturability. We present a case study of an SoC test concept, including a...
Martin Schrader, Roderick McConnell
ISCC
2002
IEEE
15 years 11 months ago
Test++: an adaptive training system on the Internet
We present an adaptive system for training and teaching. Our system integrates an adaptive training environment and a cooperative environment for exams both accessible via Interne...
Maria Barra, A. Lannaccone, Giuseppina Palmieri, V...
TII
2008
132views more  TII 2008»
15 years 6 months ago
Credential Management for Automatic Identification Solutions in Supply Chain Management
Current systems for automatic identification of goods presume a single administrative domain. However, in supply chain management systems temporary cooperations of multiple compani...
Marcel Henseler, Michael Rossberg, Guenter Schaefe...
131
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ASPDAC
2004
ACM
78views Hardware» more  ASPDAC 2004»
15 years 11 months ago
On compliance test of on-chip bus for SOC
- In this paper, we employ a monitor-based approach for on-chip bus (OCB) compliance test. To describe the OCB protocols,we proposea FSM model, which can help to extract the necess...
Hue-Min Lin, Chia-Chih Yen, Che-Hua Shih, Jing-Yan...
ITC
2003
IEEE
108views Hardware» more  ITC 2003»
15 years 11 months ago
Optical and Electrical Testing of Latchup in I/O Interface Circuits
Backside light emission and electrical measurements were used to evaluate the susceptibility to latchup of externally cabled I/O pins for a 0.13 µm technology generation [1,2] te...
Franco Stellari, Peilin Song, Moyra K. McManus, Ro...