It is widely accepted that transient failures will appear more frequently in chips designed in the near future due to several factors such as the increased integration scale. On th...
It is widely accepted that transient failures will appear more frequently in chips designed in the near future due to several factors such as the increased integration scale. On t...
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...
Andrew DeOrio, Konstantinos Aisopos, Valeria Berta...
—The number of CPUs in chip multiprocessors is growing at the Moore’s Law rate, due to continued technology advances. However, new technologies pose serious reliability challen...
Abstract. In many-core CMP architectures, the cache coherence protocol is a key component since it can add requirements of area and power consumption to the final design and, there...