Sciweavers

9166 search results - page 1769 / 1834
» A framework for comparing models of computation
Sort
View
DAC
2007
ACM
16 years 5 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
2006
ACM
16 years 5 months ago
Standard cell characterization considering lithography induced variations
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
Ke Cao, Sorin Dobre, Jiang Hu
DAC
2006
ACM
16 years 5 months ago
Prediction-based flow control for network-on-chip traffic
Networks-on-Chip (NoC) architectures provide a scalable solution to on-chip communication problem but the bandwidth offered by NoCs can be utilized efficiently only in presence of...
Ümit Y. Ogras, Radu Marculescu

Publication
207views
16 years 2 months ago
Incorporating Higher-Order Cues in Image Colorization
We consider the colorization problem of grayscale images when some pixels, called scribbles, with initial colors are given. In this paper, we propose a new multi-layer graph model ...
Tae Hoon Kim (Seoul National University), Kyoung M...
ISPASS
2009
IEEE
15 years 11 months ago
Analyzing CUDA workloads using a detailed GPU simulator
Modern Graphic Processing Units (GPUs) provide sufficiently flexible programming models that understanding their performance can provide insight in designing tomorrow’s manyco...
Ali Bakhoda, George L. Yuan, Wilson W. L. Fung, He...
« Prev « First page 1769 / 1834 Last » Next »