Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...
Networks-on-Chip (NoC) architectures provide a scalable solution to on-chip communication problem but the bandwidth offered by NoCs can be utilized efficiently only in presence of...
We consider the colorization problem of grayscale images when some pixels, called scribbles, with initial colors are given. In this paper, we propose a new multi-layer graph model ...
Tae Hoon Kim (Seoul National University), Kyoung M...
Modern Graphic Processing Units (GPUs) provide sufficiently flexible programming models that understanding their performance can provide insight in designing tomorrow’s manyco...
Ali Bakhoda, George L. Yuan, Wilson W. L. Fung, He...