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156views
13 years 1 months ago
Dynamic Virtual Ground Voltage Estimation for Power Gating
With the technology moving into the deep sub-100nm region, the increase of leakage power consumption necessitates more aggressive power reduction techniques. Power gating is a prom...
Hao Xu, Ranga Vemuri, Wen-Ben Jone
TCAD
2008
172views more  TCAD 2008»
13 years 7 months ago
General Methodology for Soft-Error-Aware Power Optimization Using Gate Sizing
Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the mos...
Foad Dabiri, Ani Nahapetian, Tammara Massey, Miodr...
GLVLSI
2009
IEEE
167views VLSI» more  GLVLSI 2009»
14 years 2 months ago
Dual-threshold pass-transistor logic design
This paper introduces pass-transistor logic design with dualthreshold voltages. A set of single-rail, fully restored, passtransistor gates are presented. Logic transistors are imp...
Lara D. Oliver, Krishnendu Chakrabarty, Hisham Z. ...
ICCD
2005
IEEE
120views Hardware» more  ICCD 2005»
14 years 4 months ago
Novel Low-Overhead Operand Isolation Techniques for Low-Power Datapath Synthesis
: Power consumption in datapath modules due to redundant switching is an important design concern for high-performance applications. Operand isolation schemes are adopted to reduce...
Nilanjan Banerjee, Arijit Raychowdhury, Swarup Bhu...
ASPDAC
2006
ACM
90views Hardware» more  ASPDAC 2006»
14 years 1 months ago
A routability constrained scan chain ordering technique for test power reduction
Abstract— For scan-based testing, the high test power consumption may cause test power management problems, and the extra scan chain connections may cause routability degradation...
X.-L. Huang, J.-L. Huang