182 search results - page 19 / 37 » A general probabilistic framework for worst case timing anal... |
COMPSAC
2008
IEEE
13 years 9 months ago
2008
IEEE
This paper presents a methodology for setting up a Decision Support system for User Interface Design (DSUID). We first motivate the role and contributions of DSUID and then demons...
ETS
2007
IEEE
13 years 9 months ago
2007
IEEE
Software-Based Self-Test (SBST) has emerged as an effective strategy for on-line testing of processors integrated in non-safety critical embedded system applications. Among the mo...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
SIGMOD
2012
ACM
11 years 10 months ago
2012
ACM
While extensive work has been done on evaluating queries over tuple-independent probabilistic databases, query evaluation over correlated data has received much less attention eve...
DAC
2006
ACM
14 years 1 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...