During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
—We present an implementation of an algorithm for constructing provably fast circuits for a class of Boolean functions with input signals that have individual starting times. We ...
In this paper we present a generic methodology for the rapid generation and implementation of standard cell libraries for differential circuit design styles. We demonstrate a syst...
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...
Abstract. Encryption of volatile FPGA bitstreams provides confidentiality to the design but does not ensure its authenticity. This paper motivates the need for adding authenticati...