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119
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VTS
2007
IEEE
116views Hardware» more  VTS 2007»
15 years 9 months ago
Case Study: Soft Error Rate Analysis in Storage Systems
Soft errors due to cosmic particles are a growing reliability threat for VLSI systems. In this paper we analyze the soft error vulnerability of FPGAs used in storage systems. Sinc...
Brian Mullins, Hossein Asadi, Mehdi Baradaran Taho...
140
Voted
GLVLSI
2000
IEEE
145views VLSI» more  GLVLSI 2000»
15 years 7 months ago
Manhattan or non-Manhattan?: a study of alternative VLSI routing architectures
Circuit interconnect has become a substantial obstacle in the design of high performance systems. In this paper we explore a new routing paradigm that strikes at the root of the i...
Cheng-Kok Koh, Patrick H. Madden
134
Voted
ICCAD
2003
IEEE
152views Hardware» more  ICCAD 2003»
16 years 10 days ago
Dynamic Fault-Tolerance and Metrics for Battery Powered, Failure-Prone Systems
Emerging VLSI technologies and platforms are giving rise to systems with inherently high potential for runtime failure. Such failures range from intermittent electrical and mechan...
Phillip Stanley-Marbell, Diana Marculescu
164
Voted
SMC
2007
IEEE
125views Control Systems» more  SMC 2007»
15 years 9 months ago
Scaling with digital connection: Services innovation
—Digitization of production factors, including the knowledge for knowledge workers and consumers, opens almost infinite potential to connect persons, systems, processes, enterpri...
Cheng Hsu
117
Voted
RECONFIG
2009
IEEE
182views VLSI» more  RECONFIG 2009»
15 years 10 months ago
Scalability Studies of the BLASTn Scan and Ungapped Extension Functions
BLASTn is a ubiquitous tool used for large scale DNA analysis. Detailed profiling tests reveal that the most computationally intensive sections of the BLASTn algorithm are the sc...
Siddhartha Datta, Ron Sass