34 search results - page 4 / 7 » A methodology for the characterization of process variation ... |
ISCI
2000
13 years 7 months ago
2000
Data Quality has many dimensions one of which is accuracy. Accuracy is usually compromised by errors accidentally or intensionally introduced in a database system. These errors re...
ICCD
2007
IEEE
14 years 4 months ago
2007
IEEE
As the VLSI technology marches beyond 65 and 45nm process technologies, variation in gate length has a direct impact on leakage and performance of CMOS transistors. Due to sub-wav...
DAC
2010
ACM
13 years 8 months ago
2010
ACM
With technology scaling down to 90nm and below, many yield-driven design and optimization methodologies have been proposed to cope with the prominent process variation and to incr...
BMCBI
2008
13 years 6 months ago
2008
Background: Recent advances in global genomic profiling methodologies have enabled multidimensional characterization of biological systems. Complete analysis of these genomic prof...
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...