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DAC
2008
ACM
14 years 10 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
DAC
2007
ACM
14 years 10 months ago
MP-trees: A Packing-Based Macro Placement Algorithm for Mixed-Size Designs
In this paper, we present a new multi-packing tree (MP-tree) representation for macro placement to handle mixed-size designs. Based on binary trees, the MP-tree is very efficient,...
Tung-Chieh Chen, Ping-Hung Yuh, Yao-Wen Chang, Fwu...
ICML
1998
IEEE
14 years 9 months ago
Bayesian Network Classification with Continuous Attributes: Getting the Best of Both Discretization and Parametric Fitting
In a recent paper, Friedman, Geiger, and Goldszmidt [8] introduced a classifier based on Bayesian networks, called Tree Augmented Naive Bayes (TAN), that outperforms naive Bayes a...
Moisés Goldszmidt, Nir Friedman, Thomas J. ...
ISBI
2006
IEEE
14 years 9 months ago
Mapping ventricular changes related to dementia and mild cognitive impairment in a large community-based cohort
We present a fully-automated technique for visualizing localized cerebral ventricle shape differences between large clinical subject groups who have received a magnetic resonance ...
Owen T. Carmichael, Paul M. Thompson, Rebecca A. D...
SPAA
2009
ACM
14 years 9 months ago
Scalable reader-writer locks
We present three new reader-writer lock algorithms that scale under high read-only contention. Many previous reader-writer locks suffer significant degradation when many readers a...
Yossi Lev, Victor Luchangco, Marek Olszewski
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