179 search results - page 21 / 36 » A new test pattern generation method for delay fault testing |
VTS
1999
IEEE
13 years 12 months ago
1999
IEEE
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...
ICECCS
2002
IEEE
14 years 16 days ago
2002
IEEE
Although program faults are widely studied, there are many aspects of faults that we still do not understand, particularly about OO software. In addition to the simple fact that o...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compa...
DSD
2005
IEEE
13 years 9 months ago
2005
IEEE
Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of f...
ATS
2009
IEEE
14 years 2 months ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...