A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-Based BIST is proposed. The incorporation of the superposition principle to the ...
This article describes an emulation-based method for locating stuck-at faults in combinational and synchronous sequential circuits. The method is based on automatically designing a...
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...
Designing a distributed fault tolerance algorithm requires careful analysis of both fault models and diagnosis strategies. A system will fail if there are too many active faults, ...