—A probabilistic diagnosis algorithm is presented for constant degree structures. The performance of the algorithm is analyzed under a negative binomial failure distribution to a...
Kaiyuan Huang, Vinod K. Agarwal, Krishnaiyan Thula...
We propose an algorithm for gate-delay fault diagnosis. It is based on the inject-and-evaluate paradigm [1], in which the fault site(s) are predicted through a series of injection...
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
Intermittent scan chain hold-time fault is discussed in this paper and a method to diagnose the faulty site in a scan chain is proposed as well. Unlike the previous scan chain dia...
Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Cheng-...
Although a number of automatic tools have been developed to detect faults, much of the diagnosis is still being done manually. To help with the diagnostic tasks, we formally intro...