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» A note on fault diagnosis algorithms
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TCAD
1998
96views more  TCAD 1998»
13 years 7 months ago
Diagnosis of clustered faults and wafer testing
—A probabilistic diagnosis algorithm is presented for constant degree structures. The performance of the algorithm is analyzed under a negative binomial failure distribution to a...
Kaiyuan Huang, Vinod K. Agarwal, Krishnaiyan Thula...
DFT
2002
IEEE
79views VLSI» more  DFT 2002»
14 years 10 days ago
Gate-Delay Fault Diagnosis Using the Inject-and-Evaluate Paradigm
We propose an algorithm for gate-delay fault diagnosis. It is based on the inject-and-evaluate paradigm [1], in which the fault site(s) are predicted through a series of injection...
Horng-Bin Wang, Shi-Yu Huang, Jing-Reng Huang
GLVLSI
2005
IEEE
118views VLSI» more  GLVLSI 2005»
14 years 1 months ago
High-diagnosability online built-in self-test of FPGAs via iterative bootstrapping
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
Vishal Suthar, Shantanu Dutt
ITC
2003
IEEE
112views Hardware» more  ITC 2003»
14 years 19 days ago
Statistical Diagnosis for Intermittent Scan Chain Hold-Time Fault
Intermittent scan chain hold-time fault is discussed in this paper and a method to diagnose the faulty site in a scan chain is proposed as well. Unlike the previous scan chain dia...
Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Cheng-...
SIGSOFT
2010
ACM
13 years 2 months ago
Path-based fault correlations
Although a number of automatic tools have been developed to detect faults, much of the diagnosis is still being done manually. To help with the diagnostic tasks, we formally intro...
Wei Le, Mary Lou Soffa