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» A novel improvement technique for high-level test synthesis
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ICSM
2005
IEEE
14 years 1 months ago
Contract-Based Mutation for Testing Components
Testing plays an important role in the maintenance of Component Based Software Development. Test adequacy for component testing is one of the hardest issues for component testing....
Ying Jiang, Shan-Shan Hou, Jinhui Shan, Lu Zhang, ...
ASPDAC
2008
ACM
104views Hardware» more  ASPDAC 2008»
13 years 9 months ago
Variability-driven module selection with joint design time optimization and post-silicon tuning
Abstract-- Increasing delay and power variation are significant challenges to the designers as technology scales to the deep sub-micron (DSM) regime. Traditional module selection t...
Feng Wang 0004, Xiaoxia Wu, Yuan Xie
TCAD
2010
102views more  TCAD 2010»
13 years 2 months ago
Functional Test Generation Using Efficient Property Clustering and Learning Techniques
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra
VLSID
2009
IEEE
115views VLSI» more  VLSID 2009»
14 years 8 months ago
Efficient Techniques for Directed Test Generation Using Incremental Satisfiability
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
Prabhat Mishra, Mingsong Chen
CVPR
2004
IEEE
14 years 9 months ago
The SPS Algorithm: Patching Figural Continuity and Transparency by Split-Patch Search
This paper describes a novel algorithm for the efficient synthesis of high-quality virtual views from only two input images. The emphasis is on the recovery of continuity of objec...
Antonio Criminisi, Andrew Blake