287 search results - page 20 / 58 » A novel improvement technique for high-level test synthesis |
ICSM
2005
IEEE
14 years 1 months ago
2005
IEEE
Software testing is a critical part of software development. Test suite sizes may grow significantly with subsequent modifications to the software over time. Due to time and res...
ICIP
2009
IEEE
13 years 5 months ago
2009
IEEE
In 3D Video (3DV) applications, a reduced number of views plus depth maps are transmitted or stored. When there is a need to render virtual views in between the actual views, the ...
DSD
2007
IEEE
14 years 2 months ago
2007
IEEE
The reduction of the cumbersome operations of multiplication, division, and powering to addition, subtraction and multiplication is what makes the Logarithmic Number System (LNS) ...
VTS
2003
IEEE
14 years 27 days ago
2003
IEEE
Reseeding is used to improve fault coverage in pseudo-random testing. Most of the work done on reseeding is based on storing the seeds in an external tester. Besides its high cost...
TVLSI
2010
13 years 2 months ago
2010
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...