Gate sizing in VLSI design is a widely-used method for power or area recovery subject to timing constraints. Several previous works have proposed gate sizing heuristics for power ...
As technology scales down, timing verification of digital integrated circuits becomes an increasingly challenging task due to the gate and wire variability. Therefore, statistical...
In this paper, we present an approved linear-time algorithm for statistical leakage analysis in the present of any spatial correlation condition (strong or weak). The new algorith...
We present an efficient and accurate gate sizing tool that employs a novel piecewise convex delay model, handling both rise and fall delays, for static CMOS gates. The delay model...
Statistical static timing analysis (SSTA) has become a key method for analyzing the effect of process variation in aggressively scaled CMOS technologies. Much research has focused...