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» A time structure based software reliability model
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ITC
2003
IEEE
129views Hardware» more  ITC 2003»
14 years 29 days ago
Relating Yield Models to Burn-In Fall-Out in Time
An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
Thomas S. Barnett, Adit D. Singh
ICDM
2002
IEEE
133views Data Mining» more  ICDM 2002»
14 years 19 days ago
Estimating the number of segments in time series data using permutation tests
Segmentation is a popular technique for discovering structure in time series data. We address the largely open problem of estimating the number of segments that can be reliably di...
Kari Vasko, Hannu Toivonen
BIBE
2007
IEEE
138views Bioinformatics» more  BIBE 2007»
14 years 2 months ago
A Flexible Stem-Based Local Search Algorithm for Predicting RNA Secondary Structures Including Pseudoknots
-We demonstrate a new algorithm named FlexStem to predict RNA secondary structures with pseudoknots. Our approach is based on the free energy minimization criterion, and utilizes a...
Xiang Chen, Simin He, Dongbo Bu, Runsheng Chen, We...
JSS
2002
90views more  JSS 2002»
13 years 7 months ago
Producing reliable software: an experiment
A customer of high assurance software recently sponsored a software engineering experiment in which a small real-time software system was developed concurrently by two popular sof...
Carol Smidts, Xin Huang, James C. Widmaier
ASPDAC
2000
ACM
111views Hardware» more  ASPDAC 2000»
14 years 1 days ago
Gate-level aged timing simulation methodology for hot-carrier reliability assurance
- This paper presents a new aged timing simulation methodology that can be used for hot-carrier reliability assurance of VLSI. This methodology consists of a compact model and a un...
Yoshiyuki Kawakami, Jingkun Fang, Hirokazu Yonezaw...