130 search results - page 6 / 26 » Accurate and scalable reliability analysis of logic circuits |
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
TC
2010
13 years 5 months ago
2010
—Reliability analysis has become a tool of fundamental importance to virtually all electrical and computer engineers because of the extensive usage of hardware systems in safety ...
TCAD
2002
13 years 6 months ago
2002
This paper introduces an accurate analysis of on-chip inductance effects for distributed interconnects that takes the effect of both the series resistance and the output parasitic ...
ISQED
2009
IEEE
14 years 1 months ago
2009
IEEE
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Soft error tolerant design becomes more crucial due to exponential increase in the vulnerability of computer systems to soft errors. Accurate estimation of soft error rate (SER), ...