81 search results - page 6 / 17 » Accurate microarchitecture-level fault modeling for studying... |
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
PODC
2012
ACM
11 years 9 months ago
2012
ACM
In recent years, there have been a few proposals to add a small amount of trusted hardware at each replica in a Byzantine fault tolerant system to cut back replication factors. Th...
ESOP
2010
Springer
14 years 4 months ago
2010
Springer
Transient faults are single-shot hardware errors caused by high energy particles from space, manufacturing defects, overheating, and other sources. Such faults can be devastating f...
ISCA
2003
IEEE
14 years 17 days ago
2003
IEEE
With power density and hence cooling costs rising exponentially, processor packaging can no longer be designed for the worst case, and there is an urgent need for runtime processo...
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
This work presents a new diagnosis method for use in an adaptive analog tester. The tester is able to detect faults in any linear circuit by learning a reference behavior in a fir...