77 search results - page 11 / 16 » Accurate models for estimating area and power of FPGA implem... |
DSD
2008
IEEE
14 years 1 months ago
2008
IEEE
Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a c...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
— Leakage power dissipation becomes a dominant component in operation power in nanometer devices. This paper describes a design methodology to implement runtime power gating in a...
APCCAS
2006
IEEE
14 years 1 months ago
2006
IEEE
— On-chip decoupling capacitors (Decaps) are widely used to mitigate on-chip power supply noise. At and below 100nm on-chip decaps face leakage and area overhead problems associa...
IPPS
2006
IEEE
14 years 1 months ago
2006
IEEE
Among different wireless LAN technologies 802.11a has recently become popular due to its high throughput, large system capacity, and relatively long range. In this paper, we prop...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
In this work we consider battery powered portable systems which either have Field Programmable Gate Arrays (FPGA) or voltage and frequency scalable processors as their main proces...