19010 search results - page 190 / 3802 » Adapting to adaptive testing |
153
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GLVLSI
2005
IEEE
15 years 10 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
113
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DATE
2010
IEEE
15 years 9 months ago
2010
IEEE
—The admission control problem is concerned with determining whether a new task may be accepted by a system consisting of a set of running tasks, such that the already admitted a...
153
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ET
2010
15 years 1 months ago
2010
This work justifies several quantum gate level fault models and discusses the causal error mechanisms thwarting correct function. A quantum adaptation of the classical test set gen...
155
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ICASSP
2011
IEEE
14 years 8 months ago
2011
IEEE
Recently, Multiple Background Models (M-BMs) [1, 2] have been shown to be useful in speaker verification, where the M-BMs are formed based on different Vocal Tract Lengths (VTLs)...
157
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APGV
2008
ACM
15 years 6 months ago
2008
ACM
Insights from human perception of moving faces have the potential to provide interesting insights for technical animation systems as well as in the neural encoding of facial expre...