21183 search results - page 135 / 4237 » Adaptive Testing by Test |
154
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EURODAC
1995
IEEE
15 years 8 months ago
1995
IEEE
We examine delay models used in VLSI circuit testing. Our study includes electrical-level simulation experiments with HSPICE. We show phenomena which signi cantly a ect the actual...
138
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EURODAC
1995
IEEE
15 years 8 months ago
1995
IEEE
We present a procedure to generate short test sequences for synchronous sequential circuits described at the gate level. Short test sequences are important in reducing test applic...
123
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PTS
2004
15 years 5 months ago
2004
The UML Testing Profile provides support for UML based model-driven testing. This paper introduces a methodology of how to use the testing profile in order to modify and extend an ...
109
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WSC
2001
15 years 5 months ago
2001
Scalability and input domain explosion make it impossible to exhaustively test simulation systems. Improved methods such as statistical usage testing are needed to provide quantit...
127
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CASCON
1996
15 years 5 months ago
1996
This paper de nes three levels of requirements for adequate code-based class testing, examining the eectiveness of traditional testing criteria in the context of object-oriented (...