21183 search results - page 140 / 4237 » Adaptive Testing by Test |
126
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DSD
2005
IEEE
15 years 10 months ago
2005
IEEE
The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the...
140
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ITC
2002
IEEE
15 years 9 months ago
2002
IEEE
1 Scan based transition tests are added to improve the detection of speed failures using scan tests. Empirical data suggests that both data volume and application time, for transi...
161
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GECCO
2010
Springer
15 years 9 months ago
2010
Springer
The increase in the complexity of modern software has led to the commensurate growth in the size and execution time of the test suites for these programs. In order to address this...
137
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DAC
1999
ACM
15 years 8 months ago
1999
ACM
Dynamic-current based test techniques can potentially address the drawbacks of traditional and Iddq test methodologies. The quality of dynamic current based test is degraded by pr...
138
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ACMSE
2007
ACM
15 years 8 months ago
2007
ACM
Testing is an essential but often under-utilized area of software engineering. A variety of software testing techniques have been developed to effectively identify bugs in source ...