21183 search results - page 163 / 4237 » Adaptive Testing by Test |
143
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
For ratio-Iddq testing, the test performance is significantly affected by the correlation between two currents of different input patterns as process parameters vary. In this p...
136
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...
139
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ICECCS
2002
IEEE
15 years 9 months ago
2002
IEEE
The characteristics of object-oriented software affect type and relevance of faults. In particular, the state of the objects may cause faults that cannot be easily revealed with t...
ITC
2000
IEEE
15 years 9 months ago
2000
IEEE
This paper describes the results of testing 50 single inline memory modules (SIMMs), each containing 16 16Mbit DRAM chips (DUTs); 39 SIMMs failed, and of the 800 DUTs, 116failed. ...
143
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DAC
1997
ACM
15 years 8 months ago
1997
ACM
Novel test bench techniques are required to cope with a functional test complexity which is predicted to grow much more strongly than design complexity. Our test bench approach at...