21183 search results - page 20 / 4237 » Adaptive Testing by Test |
130
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VTS
1997
IEEE
15 years 7 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
137
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MKWI
2008
15 years 5 months ago
2008
: Along with rapidly changing market requirements for service-oriented business software new challenges for quality management, quality assurance, and testing arise. Customers must...
120
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FLAIRS
2007
15 years 6 months ago
2007
In this paper we present a novel approach for patternconstrained test case generation. The generation of test cases with known characteristics is usually a non-trivial task. In co...
121
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ETS
2009
IEEE
15 years 1 months ago
2009
IEEE
This paper reports two novel algorithms based on time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both ...
114
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ISSRE
2000
IEEE
15 years 8 months ago
2000
IEEE
A coverage testing tool ATACOBOL (Automatic Test Analysis for COBOL) that applies data flow coverage technique is developed for software development on IBM System/390 mainframe. W...