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114
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DATE
2002
IEEE
103views Hardware» more  DATE 2002»
15 years 8 months ago
Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data Compression
We present a new test resource partitioning (TRP) technique for reduced pin-count testing of system-on-a-chip (SOC). The proposed technique is based on test data compression and o...
Anshuman Chandra, Krishnendu Chakrabarty
138
Voted
SERP
2007
15 years 5 months ago
From Functional Requirements through Test Evaluation Design to Automatic Test Data Patterns Retrieval - a Concept for Testing of
- Functional testing of software dedicated for hybrid embedded systems should start at the early development phase and requires analysis of discrete and continuous signals, where t...
Justyna Zander-Nowicka, Abel Marrero Pérez,...
98
Voted
TAP
2007
Springer
80views Hardware» more  TAP 2007»
15 years 9 months ago
Test-Sequence Generation with Hol-TestGen with an Application to Firewall Testing
Achim D. Brucker, Burkhart Wolff
125
Voted
BMCBI
2007
125views more  BMCBI 2007»
15 years 3 months ago
Statistical tests to compare motif count exceptionalities
Background: Finding over- or under-represented motifs in biological sequences is now a common task in genomics. Thanks to p-value calculation for motif counts, exceptional motifs ...
Stéphane Robin, Sophie Schbath, Vincent Van...
DAC
2004
ACM
16 years 4 months ago
Efficient on-line testing of FPGAs with provable diagnosabilities
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...
Vinay Verma, Shantanu Dutt, Vishal Suthar