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137
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ACTAC
1999
15 years 3 months ago
1999
Conformance testing is based on a test suite. Standardization committees release standard test suites, which consist of hundreds of test cases. The main problem of conformance tes...
130
Voted
ICCAD
2008
IEEE
16 years 20 days ago
2008
IEEE
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the ...
111
Voted
DATE
2005
IEEE
15 years 9 months ago
2005
IEEE
Multi-site testing is a popular and effective way to increase test throughput and reduce test costs. We present a test throughput model, in which we focus on wafer testing, and co...
155
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DFT
2002
IEEE
15 years 8 months ago
2002
IEEE
Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...
120
Voted
XPU
2004
Springer
15 years 9 months ago
2004
Springer
Abstract. User acceptance testing is finally getting the attention and tool support it deserves. It is imperative that acceptance tests follow the best practices and embody the cri...