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ASPDAC
2006
ACM
119views Hardware» more  ASPDAC 2006»
15 years 9 months ago
A dynamic test compaction procedure for high-quality path delay testing
- We propose a dynamic test compaction procedure to generate high-quality test patterns for path delay faults. While the proposed procedure generates a compact two-pattern test set...
Masayasu Fukunaga, Seiji Kajihara, Xiaoqing Wen, T...
ATS
2002
IEEE
110views Hardware» more  ATS 2002»
15 years 8 months ago
Test Requirement Analysis for Low Cost Hierarchical Test Path Construction
We propose a methodology that examines design modules and identifies appropriate vector justification and response propagation requirements for hierarchical test. Based on a cel...
Yiorgos Makris, Alex Orailoglu
129
Voted
GI
2009
Springer
15 years 1 months ago
A Generic Approach for Modeling Test Case Priorities with Applications for Test Development and Execution
: This contribution addresses systematic test development methods to include an algorithm to retrieve a test suite execution control in order to run test cases with high priority e...
Andreas Hoffmann, Axel Rennoch, Ina Schieferdecker...
137
Voted
ISSTA
2006
ACM
15 years 9 months ago
Integrating customized test requirements with traditional requirements in web application testing
Existing test suite reduction techniques employed for testing web applications have either used traditional program coverage-based requirements or usage-based requirements. In thi...
Sreedevi Sampath, Sara Sprenkle, Emily Gibson, Lor...
DATE
2006
IEEE
94views Hardware» more  DATE 2006»
15 years 9 months ago
Reuse-based test access and integrated test scheduling for network-on-chip
In this paper, we propose a new method for test access and test scheduling in NoC-based system. It relies on a progressive reuse of the network resources for transporting test dat...
Chunsheng Liu, Zach Link, Dhiraj K. Pradhan