21183 search results - page 49 / 4237 » Adaptive Testing by Test |
130
Voted
DATE
2006
IEEE
15 years 9 months ago
2006
IEEE
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...
144
Voted
DSD
2005
IEEE
15 years 9 months ago
2005
IEEE
1 This paper presents a method for power-constrained system-on-chip test scheduling in an abort-on-first-fail environment where the test is terminated as soon as a fault is detecte...
133
Voted
XPU
2004
Springer
15 years 9 months ago
2004
Springer
Abstract. While there are many excellent acceptance testing tools and frameworks available today, this paper presents an alternative approach, involving generating code from tests ...
115
Voted
ISQED
2003
IEEE
15 years 9 months ago
2003
IEEE
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
127
Voted
ITC
2002
IEEE
15 years 8 months ago
2002
IEEE
ct Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment that...