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DATE
1999
IEEE
102views Hardware» more  DATE 1999»
15 years 8 months ago
Minimal Length Diagnostic Tests for Analog Circuits using Test History
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
Alfred V. Gomes, Abhijit Chatterjee
ICSE
2004
IEEE-ACM
16 years 3 months ago
Automated Generation of Test Programs from Closed Specifications of Classes and Test Cases
Most research on automated specification-based software testing has focused on the automated generation of test cases. Before a software system can be tested, it must be set up ac...
Wee Kheng Leow, Siau-Cheng Khoo, Yi Sun
FATES
2003
Springer
15 years 9 months ago
JMLAutoTest: A Novel Automated Testing Framework Based on JML and JUnit
Abstract. Writing specifications using Java Modeling Language has been accepted for a long time as a practical approach to increasing the correctness and quality of Java programs. ...
Guoqing Xu, Zongyuang Yang
ICCD
2003
IEEE
130views Hardware» more  ICCD 2003»
16 years 21 days ago
On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume
This paper presents a pinpoint test set relaxation method for test compression that maximally derives the capability of a run-length encoding technique such as Golomb coding or fr...
Seiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Cha...
ICSM
2009
IEEE
15 years 10 months ago
Introducing a test suite similarity metric for event sequence-based test cases
Most of today’s event driven software (EDS) systems are tested using test cases that are carefully constructed as sequences of events; they test the execution of an event in the...
Penelope A. Brooks, Atif M. Memon