21183 search results - page 54 / 4237 » Adaptive Testing by Test |
106
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ESEM
2007
ACM
15 years 7 months ago
2007
ACM
This paper presents a controlled experiment comparing the defect detection efficiency of exploratory testing (ET) and test case based testing (TCT). While traditional testing lite...
112
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TOPNOC
2008
15 years 3 months ago
2008
Abstract. We consider software systems consisting of a single component running one sequential process only. We model such software systems as a special class of transition systems...
134
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DAC
2008
ACM
16 years 4 months ago
2008
ACM
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
159
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ICCD
2003
IEEE
15 years 9 months ago
2003
IEEE
Excessive switching activity during shift cycles in scan-based cores imposes considerable test power challenges. To ensure rapid and reliable test of SOCs, we propose a scan chain...
134
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TAP
2010
Springer
15 years 8 months ago
2010
Springer
Abstract. We consider the problem of test generation for Boolean combinational circuits. We use a novel approach based on the idea of treating tests as a proof encoding rather than...