21183 search results - page 59 / 4237 » Adaptive Testing by Test |
171
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ATS
2004
IEEE
15 years 7 months ago
2004
IEEE
Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce b...
156
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JOT
2008
15 years 3 months ago
2008
In recent years, agent-based systems have received considerable attention in both academics and industry. The agent-oriented paradigm can be considered a natural extension to the ...
120
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ICCAD
2004
IEEE
16 years 22 days ago
2004
IEEE
— In this paper we investigate an effective approach to construct a linear decompression network in the multiple scan chain architecture. A minimal pin architecture, complemented...
137
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ISSRE
2003
IEEE
15 years 9 months ago
2003
IEEE
Systematic design testing, in which executable models of behaviors are tested using inputs that exercise scenarios, can help reveal flaws in designs before they are implemented i...
109
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ITC
2000
IEEE
15 years 8 months ago
2000
IEEE
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...