21183 search results - page 61 / 4237 » Adaptive Testing by Test |
118
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ISCAS
1995
IEEE
15 years 7 months ago
1995
IEEE
: Configurations of adders and registers, which are available in tnany datapaths, can be utilized to generate pattems and to compact test responses. Thispaper unalyzes tlie patiern...
128
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ASPDAC
2007
ACM
15 years 7 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
137
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DSD
2010
IEEE
15 years 4 months ago
2010
IEEE
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
147
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TAICPART
2010
IEEE
15 years 2 months ago
2010
IEEE
We report on how the Wrangler refactoring tool has been used to improve and transform test code for Erlang systems. This has been achieved through the removal of code clones, the i...
155
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ICSE
2003
IEEE-ACM
16 years 3 months ago
2003
IEEE-ACM
Software system faults are often caused by unexpected interactions among components. Yet the size of a test suite required to test all possible combinations of interactions can be...