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DATE
2003
IEEE
114views Hardware» more  DATE 2003»
15 years 9 months ago
A New Approach to Test Generation and Test Compaction for Scan Circuits
We propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors...
Irith Pomeranz, Sudhakar M. Reddy
COMPSAC
1996
IEEE
15 years 8 months ago
Applying Conventional Testing Techniques for Class Testing
This paper discusses how conventional testing criteria such as branch coverage can be applied for the testing of member functions inside a class. To support such testing technique...
In Sang Chung, Malcolm Munro, Wan Kwon Lee, Yong R...
ETS
2009
IEEE
79views Hardware» more  ETS 2009»
15 years 1 months ago
Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead
Structural on-line self-test may be performed to detect permanent faults and avoid their accumulation. This paper improves concurrent BIST techniques based on a deterministic test ...
Michael A. Kochte, Christian G. Zoellin, Hans-Joac...
ISSTA
2009
ACM
15 years 10 months ago
Automatic system testing of programs without test oracles
Metamorphic testing has been shown to be a simple yet effective technique in addressing the quality assurance of applications that do not have test oracles, i.e., for which it is ...
Christian Murphy, Kuang Shen, Gail E. Kaiser
126
Voted
ICML
2006
IEEE
16 years 4 months ago
Feature value acquisition in testing: a sequential batch test algorithm
In medical diagnosis, doctors often have to order sets of medical tests in sequence in order to make an accurate diagnosis of patient diseases. While doing so they have to make a ...
Victor S. Sheng, Charles X. Ling