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125
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DATE
2005
IEEE
15 years 9 months ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
141
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TSE
2002
15 years 3 months ago
2002
Although there has been recent research into ways to design environments that enable end users to create their own programs, little attention has been given to helping these end u...
135
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COMPSAC
2009
IEEE
15 years 1 months ago
2009
IEEE
1 The paper proposes a new test model, Call-For-Testing (CFT), and applies it to User Acceptance Testing (UAT) of Web Applications. Different from traditional approaches, UAT in th...
126
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DATE
2008
IEEE
15 years 10 months ago
2008
IEEE
The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the...
123
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ISSRE
2008
IEEE
15 years 10 months ago
2008
IEEE
We present a novel specification-based approach for generating tests for products in a software product line. Given properties of features as first-order logic formulas, our app...