The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
Current-based tests are the most effective methods available to detect resistive shorts. Delta IDDQ testing is the most sensitive variant and can handle off-state currents of 10-1...
This paper considers the development of envelope methods as a tool for simulation. Envelope methods are based on the construction of simple envelopes to functions. The proposed en...
Thanks to their high performance and programmability, the latest graphics cards can now be used for scientific purpose. They are indeed very efficient parallel Single Instruction ...
The following article presents a novel, adaptive initialization scheme that can be applied to most state-of-the-art Speaker Diarization algorithms, i.e. algorithms that use agglom...