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JMLR
2012
12 years 12 days ago
Bayesian Comparison of Machine Learning Algorithms on Single and Multiple Datasets
We propose a new method for comparing learning algorithms on multiple tasks which is based on a novel non-parametric test that we call the Poisson binomial test. The key aspect of...
Alexandre Lacoste, François Laviolette, Mar...
ICST
2008
IEEE
14 years 4 months ago
Distributed In Vivo Testing of Software Applications
The in vivo software testing methodology focuses on testing live applications by executing unit tests throughout the lifecycle, including after deployment. The motivation is that ...
Matt Chu, Christian Murphy, Gail E. Kaiser
ITC
2002
IEEE
94views Hardware» more  ITC 2002»
14 years 2 months ago
Techniques to Reduce Data Volume and Application Time for Transition Test
1 Scan based transition tests are added to improve the detection of speed failures using scan tests. Empirical data suggests that both data volume and application time, for transi...
Xiao Liu, Michael S. Hsiao, Sreejit Chakravarty, P...
COR
2008
93views more  COR 2008»
13 years 10 months ago
Improving solver success in reaching feasibility for sets of nonlinear constraints
Whether a given nonlinear solver can reach a feasible point for a set of nonlinear constraints depends heavily on the initial point provided. We develop a range of computationally...
Walid Ibrahim, John W. Chinneck
ITC
2003
IEEE
146views Hardware» more  ITC 2003»
14 years 3 months ago
A New Approach for Low Power Scan Testing
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing has become a critical problem. In our studies on practical LSI manufacturing, we ha...
Takaki Yoshida, Masafumi Watari