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30

ITC
2003
IEEE

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A New Approach for Low Power Scan Testing

14 years 4 months ago

A New Approach for Low Power Scan Testing

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As semiconductor manufacturing technology advances, power dissipation and noise in scan testing has become a critical problem. In our studies on practical LSI manufacturing, we have found that power supply voltage drops cause testing problems during shift operations in scan testing and we have analyzed this phenomenon and its causes. In this paper, we present a new testing method named MD-SCAN (Multi Duty-Scan) which solves power supply voltage drop problems in scan testing, as well as offering an efficient method of application. .

Takaki Yoshida, Masafumi Watari

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Hardware | ITC 2003 | Power Supply Voltage | Scan Testing | Supply Voltage Drop |

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Added	04 Jul 2010
Updated	04 Jul 2010
Type	Conference
Year	2003
Where	ITC
Authors	Takaki Yoshida, Masafumi Watari

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