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ALT
2005
Springer
14 years 7 months ago
Measuring Statistical Dependence with Hilbert-Schmidt Norms
Abstract. We propose an independence criterion based on the eigenspectrum of covariance operators in reproducing kernel Hilbert spaces (RKHSs), consisting of an empirical estimate ...
Arthur Gretton, Olivier Bousquet, Alex J. Smola, B...
DAC
2003
ACM
14 years 11 months ago
Test cost reduction for SOCs using virtual TAMs and lagrange multipliers
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
Anuja Sehgal, Vikram Iyengar, Mark D. Krasniewski,...
SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
14 years 3 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...
HOTSWUP
2009
ACM
14 years 1 months ago
Efficient Systematic Testing for Dynamically Updatable Software
Recent years have seen significant advances in dynamic software updating (DSU) systems, which allow programs to be patched on the fly. However, a significant challenge remains: Ho...
Christopher M. Hayden, Eric A. Hardisty, Michael W...
KBSE
2007
IEEE
14 years 4 months ago
Synthesis of test purpose directed reactive planning tester for nondeterministic systems
We describe a model-based construction of an online tester for black-box testing of implementation under test (IUT). The external behavior of the IUT is modeled as an output obser...
Jüri Vain, Kullo Raiend, Andres Kull, Juhan P...