A hierarchical scheme with cells and modules is crucial for managing design complexity during a large integrated circuit design. We present a methodology for thermal aware cell-ba...
Silicon nanowires are a promising solution to address the increasing challenges of fabrication and design at the future nodes of the Complementary Metal-Oxide-Semiconductor (CMOS)...
M. Haykel Ben Jamaa, Yusuf Leblebici, Giovanni De ...
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vul...
Cooperative intrusion detection techniques for MANETs utilize ordinary computing hosts as network intrusion sensors. If compromised, these hosts may inject bogus data into the int...
Daniel Sterne, Geoffrey Lawler, Richard Gopaul, Br...