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GLVLSI
2005
IEEE
122views VLSI» more  GLVLSI 2005»
14 years 1 months ago
Thermal aware cell-based full-chip electromigration reliability analysis
A hierarchical scheme with cells and modules is crucial for managing design complexity during a large integrated circuit design. We present a methodology for thermal aware cell-ba...
Syed M. Alam, Donald E. Troxel, Carl V. Thompson
DAC
2009
ACM
14 years 8 months ago
Decoding nanowire arrays fabricated with the multi-spacer patterning technique
Silicon nanowires are a promising solution to address the increasing challenges of fabrication and design at the future nodes of the Complementary Metal-Oxide-Semiconductor (CMOS)...
M. Haykel Ben Jamaa, Yusuf Leblebici, Giovanni De ...
DAC
2008
ACM
14 years 8 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
DAC
2006
ACM
14 years 8 months ago
FLAW: FPGA lifetime awareness
Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vul...
Suresh Srinivasan, Prasanth Mangalagiri, Yuan Xie,...
ACSAC
2007
IEEE
14 years 2 months ago
Countering False Accusations and Collusion in the Detection of In-Band Wormholes
Cooperative intrusion detection techniques for MANETs utilize ordinary computing hosts as network intrusion sensors. If compromised, these hosts may inject bogus data into the int...
Daniel Sterne, Geoffrey Lawler, Richard Gopaul, Br...