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DATE
2003
IEEE
131views Hardware» more  DATE 2003»
14 years 2 months ago
High Speed and Highly Testable Parallel Two-Rail Code Checker
In this article we propose a high speed and highly testable parallel two-rail code checker, which features a compact structure and is Totally-Self-Checking or Strongly Code-Disjoi...
Martin Omaña, Daniele Rossi, Cecilia Metra
DEXAW
2003
IEEE
108views Database» more  DEXAW 2003»
14 years 2 months ago
Electronic Voting Systems: Security Implications of the Administrative Workflow
With the rapid growth of the Internet, online voting appears to be a reasonable alternative to conventional elections and other opinion expressing processes. Current research focu...
Costas Lambrinoudakis, Spyros Kokolakis, Maria Kar...
DFT
2003
IEEE
100views VLSI» more  DFT 2003»
14 years 2 months ago
Scan-Based BIST Diagnosis Using an Embedded Processor
For system-on-chip designs that contain an embedded processor, this paper present a software based diagnosis scheme that can make use of the processor to aid in diagnosis in a sca...
Kedarnath J. Balakrishnan, Nur A. Touba
DFT
2003
IEEE
120views VLSI» more  DFT 2003»
14 years 2 months ago
Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS)
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Che...
DISCEX
2003
IEEE
14 years 2 months ago
Willow System Demonstration
Dealing with damage that arises during operation of networked information systems is essential if such systems are to provide the dependability required by modern critical applica...
John C. Knight, Jonathan Hill, Philip E. Varner, P...