We report test results from a prototype asynchronous FPGA (AFPGA) implemented in TSMC’s 0.18μm CMOS process. The AFPGA uses SRAM-based configuration bits with pipelined logic ...
Code coverage analysis, the process of finding code exercised by a particular set of test inputs, is an important component of software development and verification. Most tradit...
Alex Shye, Matthew Iyer, Vijay Janapa Reddi, Danie...
— Accurate generation of circuit specifications from test signatures is a difficult problem, since analytical expressions cannot precisely describe the nonlinear relationships ...
Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun,...
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...
- Two fault isolation approaches based on Combinatorial Group Testing (CGT) are presented. Although they both share the basic principle of grouping suspect resources into subgroups...
Rawad N. Al-Haddad, Carthik A. Sharma, Ronald F. D...