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FCCM
2005
IEEE
111views VLSI» more  FCCM 2005»
14 years 3 months ago
A High-Performance Asynchronous FPGA: Test Results
We report test results from a prototype asynchronous FPGA (AFPGA) implemented in TSMC’s 0.18μm CMOS process. The AFPGA uses SRAM-based configuration bits with pipelined logic ...
David Fang, John Teifel, Rajit Manohar
AADEBUG
2005
Springer
14 years 3 months ago
Code coverage testing using hardware performance monitoring support
Code coverage analysis, the process of finding code exercised by a particular set of test inputs, is an important component of software development and verification. Most tradit...
Alex Shye, Matthew Iyer, Vijay Janapa Reddi, Danie...
ETS
2006
IEEE
100views Hardware» more  ETS 2006»
14 years 4 months ago
Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters
— Accurate generation of circuit specifications from test signatures is a difficult problem, since analytical expressions cannot precisely describe the nonlinear relationships ...
Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun,...
DAC
1996
ACM
14 years 2 months ago
Pseudorandom-Pattern Test Resistance in High-Performance DSP Datapaths
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...
Laurence Goodby, Alex Orailoglu
ERSA
2007
108views Hardware» more  ERSA 2007»
13 years 11 months ago
Performance Evaluation of Two Allocation Schemes for Combinatorial Group Testing Fault Isolation
- Two fault isolation approaches based on Combinatorial Group Testing (CGT) are presented. Although they both share the basic principle of grouping suspect resources into subgroups...
Rawad N. Al-Haddad, Carthik A. Sharma, Ronald F. D...