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MTV
2007
IEEE
118views Hardware» more  MTV 2007»
14 years 4 months ago
Reduction of Power Dissipation during Scan Testing by Test Vector Ordering
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
Wang-Dauh Tseng, Lung-Jen Lee
ICST
2009
IEEE
14 years 4 months ago
Transforming and Selecting Functional Test Cases for Security Policy Testing
In this paper, we consider typical applications in which the business logic is separated from the access control logic, implemented in an independent component, called the Policy ...
Tejeddine Mouelhi, Yves Le Traon, Benoit Baudry
ICSE
1994
IEEE-ACM
14 years 2 months ago
TestTube: A System for Selective Regression Testing
This paper describes a system called TESTTUBE that combines static and dynamic analysis to perform selective retesting of software systems written in C. TESTTUBEfirst identifies w...
Yih-Farn Chen, David S. Rosenblum, Kiem-Phong Vo
DATE
2008
IEEE
126views Hardware» more  DATE 2008»
13 years 11 months ago
State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores
1 We present a new type of Linear Feedback Shift Registers, State Skip LFSRs. State Skip LFSRs are normal LFSRs with the addition of a small linear circuit, the State Skip circuit,...
V. Tenentes, Xrysovalantis Kavousianos, Emmanouil ...
DATE
2009
IEEE
151views Hardware» more  DATE 2009»
14 years 4 months ago
pTest: An adaptive testing tool for concurrent software on embedded multicore processors
—More and more processor manufacturers have launched embedded multicore processors for consumer electronics products because such processors provide high performance and low powe...
Shou-Wei Chang, Kun-Yuan Hsieh, Jenq Kuen Lee