7253 search results - page 44 / 1451 » Agile Performance Testing |
ATS
2010
IEEE
13 years 6 months ago
2010
IEEE
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
ICSE
2004
IEEE-ACM
14 years 10 months ago
2004
IEEE-ACM
Most research on automated specification-based software testing has focused on the automated generation of test cases. Before a software system can be tested, it must be set up ac...
ITC
2000
IEEE
14 years 2 months ago
2000
IEEE
Transient Signal Analysis (TSA) is a Go/No-Go device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, a technique based o...
DSD
2010
IEEE
13 years 10 months ago
2010
IEEE
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
ET
2002
13 years 9 months ago
2002
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CASBUS that solves ...