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119
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ITC
2003
IEEE
132views Hardware» more  ITC 2003»
15 years 7 months ago
Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...
Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muh...
DATE
2000
IEEE
139views Hardware» more  DATE 2000»
15 years 7 months ago
A VHDL Error Simulator for Functional Test Generation
This paper describes an efficient error simulator able to analyze functional VHDL descriptions. The proposed simulation environment can be based on commercial VHDL simulators. Al...
Alessandro Fin, Franco Fummi
ATS
2001
IEEE
137views Hardware» more  ATS 2001»
15 years 6 months ago
Compaction Schemes with Minimum Test Application Time
Testing embedded cores in a System-on-a-chip necessitates the use of a Test Access Mechanism, which provides for transportation of the test data between the chip and the core I/Os...
Ozgur Sinanoglu, Alex Orailoglu
120
Voted
PTS
2008
123views Hardware» more  PTS 2008»
15 years 4 months ago
Model-Based Firewall Conformance Testing
Firewalls are a cornerstone of todays security infrastructure for networks. Their configuration, implementing a firewall policy, is inherently complex, hard to understand, and diff...
Achim D. Brucker, Lukas Brügger, Burkhart Wol...
CHI
2005
ACM
16 years 2 months ago
A meeting browser evaluation test
We introduce a browser evaluation test (BET), and describe a trial run application of the test. BET is a method for assessing meeting browser performance using the number of obser...
Pierre Wellner, Mike Flynn, Simon Tucker, Steve Wh...