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DAC
2009
ACM
14 years 10 months ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
DAC
2007
ACM
14 years 10 months ago
Trusted Hardware: Can It Be Trustworthy?
Processing and storage of confidential or critical information is an every day occurrence in computing systems. The trustworthiness of computing devices has become an important co...
Cynthia E. Irvine, Karl N. Levitt
DAC
2004
ACM
14 years 10 months ago
Toward a methodology for manufacturability-driven design rule exploration
Resolution enhancement techniques (RET) such as optical proximity correction (OPC) and phase-shift mask (PSM) technology are deployed in modern processes to increase the fidelity ...
Luigi Capodieci, Puneet Gupta, Andrew B. Kahng, De...
ISBI
2004
IEEE
14 years 10 months ago
SCIRun/BioPSE: Integrated Problem Solving Environment for Bioelectric Field Problems and Visualization
SCIRun is a general purpose problem solving environment that seeks to integrate the steps of preparing, executing, and visualizing simulations of physical and biological systems. ...
Robert S. MacLeod, David M. Weinstein, J. Davison ...
WWW
2008
ACM
14 years 10 months ago
Wishful search: interactive composition of data mashups
With the emergence of Yahoo Pipes and several similar services, data mashup tools have started to gain interest of business users. Making these tools simple and accessible to user...
Anton Riabov, Eric Bouillet, Mark Feblowitz, Zhen ...