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DAC
2003
ACM
14 years 2 months ago
Test generation for designs with multiple clocks
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
Xijiang Lin, Rob Thompson
DAC
2007
ACM
14 years 9 months ago
Scan Test Planning for Power Reduction
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
DAC
2003
ACM
14 years 9 months ago
Seed encoding with LFSRs and cellular automata
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...
Ahmad A. Al-Yamani, Edward J. McCluskey
SIGOPS
2011
210views Hardware» more  SIGOPS 2011»
13 years 3 months ago
Small trusted primitives for dependable systems
Secure, fault-tolerant distributed systems are difficult to build, to validate, and to operate. Conservative design for such systems dictates that their security and fault toleran...
Petros Maniatis, Byung-Gon Chun
CODES
2010
IEEE
13 years 5 months ago
Hardware/software optimization of error detection implementation for real-time embedded systems
This paper presents an approach to system-level optimization of error detection implementation in the context of fault-tolerant realtime distributed embedded systems used for safe...
Adrian Lifa, Petru Eles, Zebo Peng, Viacheslav Izo...