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ISQED
2002
IEEE
203views Hardware» more  ISQED 2002»
14 years 17 days ago
Automatic Test Program Generation from RT-Level Microprocessor Descriptions
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
JSAC
2010
131views more  JSAC 2010»
13 years 6 months ago
Joint synchronization and localization using TOAs: A linearization based WLS solution
—Joint synchronization and localization using time of arrival (TOA) measurements is a very important research topic for many wireless ad hoc sensor network applications. For such...
Shouhong Zhu, Zhiguo Ding
ASC
2007
13 years 7 months ago
Evolving an artificial neural network classifier for condition monitoring of rotating mechanical systems
We present the results of our investigation into the use of Genetic Algorithms (GAs) for identifying near optimal design parameters of diagnostic systems that are based on Artifici...
Abhinav Saxena, Ashraf Saad
DAC
2007
ACM
14 years 8 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
RTSS
2009
IEEE
14 years 2 months ago
Towards Stable Network Performance in Wireless Sensor Networks
Abstract—Many applications in wireless sensor networks require communication performance that is both consistent and high quality. Unfortunately, performance of current network p...
Shan Lin, Gang Zhou, Kamin Whitehouse, Yafeng Wu, ...