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126
Voted
DAC
2006
ACM
16 years 4 months ago
2006
ACM
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
200
Voted
ICML
2007
IEEE
16 years 4 months ago
2007
IEEE
Correlation is one of the most widely used similarity measures in machine learning like Euclidean and Mahalanobis distances. However, compared with proposed numerous discriminant ...
125
Voted
ICML
2004
IEEE
16 years 4 months ago
2004
IEEE
We present an algorithmic framework for supervised classification learning where the set of labels is organized in a predefined hierarchical structure. This structure is encoded b...
115
Voted
WWW
2005
ACM
16 years 4 months ago
2005
ACM
This work aims a two-fold contribution: it presents a software to analyse logfiles and visualize popular web hot spots and, additionally, presents an algorithm to use this informa...
107
Voted
KDD
2005
ACM
16 years 4 months ago
2005
ACM
In this paper, we discuss a problem of finding risk patterns in medical data. We define risk patterns by a statistical metric, relative risk, which has been widely used in epidemi...